The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Jan. 15, 2020
Applicant:

Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;

Inventors:

Cheng-Tai Hsiao, Tainan, TW;

Yen-Chang Chu, Tainan, TW;

Hsun-Chung Kuang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/22 (2006.01); H01L 43/02 (2006.01); H01L 23/528 (2006.01); H01L 43/12 (2006.01); G11C 11/16 (2006.01); H01F 10/32 (2006.01); H01F 41/34 (2006.01); H01L 23/522 (2006.01);
U.S. Cl.
CPC ...
H01L 27/228 (2013.01); G11C 11/161 (2013.01); H01F 10/3259 (2013.01); H01F 41/34 (2013.01); H01L 23/528 (2013.01); H01L 23/5226 (2013.01); H01L 43/02 (2013.01); H01L 43/12 (2013.01);
Abstract

Each memory cell in an array includes a vertical stack that comprises a bottom electrode, a memory element, and a top electrode. An etch stop dielectric layer is formed over the array of memory cells. A first dielectric matrix layer is formed over the etch stop dielectric layer. The top surface of the first dielectric matrix layer is raised in a memory array region relative to a logic region due to topography. The first dielectric matrix layer is planarized by performing a chemical mechanical planarization process using top portions of the etch stop dielectric layer. A second dielectric matrix layer is formed over the first dielectric matrix layer. Metallic cell contact structures are formed through the second dielectric matrix layer on a respective subset of the top electrodes over vertically protruding portions of the etch stop dielectric layer that laterally surround the array of vertical stacks.


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