The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Jul. 15, 2019
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Hidehiro Fujiwara, Hsinchu, TW;

Li-Wen Wang, Taichung, TW;

Yen-Huei Chen, Jhudong Township, TW;

Hung-Jen Liao, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11 (2006.01); H01L 23/528 (2006.01); H01L 23/522 (2006.01); H01L 27/02 (2006.01); G06F 30/394 (2020.01);
U.S. Cl.
CPC ...
H01L 23/528 (2013.01); G06F 30/394 (2020.01); H01L 23/5226 (2013.01); H01L 27/0207 (2013.01); H01L 27/1104 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A method of designing a memory circuit is provided that includes generating a layout of a first memory cell using an integrated circuit design system. The layout of the first memory cell is generated by routing a first word line in a first layer on a first level, and routing a second word line in the first layer. Also, the method includes generating a layout of a second memory cell using the integrated circuit design system. The layout of the second memory cell is generated by routing a third word line in the first layer, the second word line being between the first word line and the third word line, and routing a fourth word line in the first layer, the third word line being between the second word line and the fourth word line. Moreover, the method includes assigning a first color scheme to the first word line and to the third word line, and assigning a second color scheme to the second word line and to the fourth word line. The first color scheme is associated with a first manufacturing process using a first mask and the second color scheme is associated with a second manufacturing process using a second mask.


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