The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Apr. 09, 2018
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Taro Ikeda, Yamanashi, JP;

Yuki Osada, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); C23C 16/52 (2006.01); H01J 37/32 (2006.01); C23C 16/54 (2006.01); C23C 14/54 (2006.01); C23C 16/455 (2006.01); C23C 16/511 (2006.01);
U.S. Cl.
CPC ...
H01L 22/24 (2013.01); C23C 14/54 (2013.01); C23C 16/4558 (2013.01); C23C 16/45508 (2013.01); C23C 16/511 (2013.01); C23C 16/52 (2013.01); C23C 16/54 (2013.01); H01J 37/32192 (2013.01); H01J 37/32935 (2013.01); H01J 37/32954 (2013.01); H01L 22/12 (2013.01); H01J 37/32972 (2013.01);
Abstract

Provided is a plasma processing apparatus including: a plurality of gas supply nozzles which are provided on a wall surface of a processing container and supply process gas toward the inside of the processing container in a radial direction; N microwave introducing modules of which the number disposed in a circumferential direction of a ceiling plate of the processing container so as to introduce microwaves for generating plasma into the processing container, in which N≥2; and M sensors provided on the wall surface of the processing container so as to monitor at least any one of electron density Ne and electron temperature Te of the plasma generated in the processing container, in which M equals to N or a multiple of N.


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