The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Aug. 28, 2019
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

Gregory A. Martin, Lake Oswego, OR (US);

Patrick Satarzadeh, San Jose, CA (US);

John J. Pickerd, Hillsboro, OR (US);

Daniel G. Knierim, Beaverton, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/66 (2006.01); H03M 1/10 (2006.01); H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1071 (2013.01); H03M 1/005 (2013.01); H03M 1/661 (2013.01);
Abstract

A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.


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