The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Sep. 01, 2020
Applicant:
Sigray, Inc., Concord, CA (US);
Inventors:
Wenbing Yun, Walnut Creek, CA (US);
Sylvia Jia Yun Lewis, San Francisco, CA (US);
Janos Kirz, Berkeley, CA (US);
Benjamin Donald Stripe, Walnut Creek, CA (US);
Assignee:
Sigray, Inc., Concord, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/22 (2018.01); G01N 23/2204 (2018.01); G01N 23/2209 (2018.01); G01N 23/223 (2006.01); G01N 23/207 (2018.01); G01N 23/20016 (2018.01); G01N 23/20025 (2018.01); G01N 23/2055 (2018.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 23/207 (2013.01); G01N 23/20016 (2013.01); G01N 23/20025 (2013.01); G01N 23/2055 (2013.01); G01N 23/22 (2013.01); G01N 23/2204 (2013.01); G01N 23/2209 (2018.02); G01N 2223/3306 (2013.01); G01N 2223/607 (2013.01); G01N 2223/61 (2013.01);
Abstract
A system and a method use x-ray fluorescence to analyze a specimen by illuminating a specimen with an incident x-ray beam having a near-grazing incident angle relative to a surface of the specimen and while the specimen has different rotational orientations relative to the incident x-ray beam. Fluorescence x-rays generated by the specimen in response to the incident x-ray beam are collected while the specimen has the different rotational orientations.