The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 2021

Filed:

Aug. 21, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Diana C. Majerus, Bosie, ID (US);

Scott D. Van De Graaff, Boise, ID (US);

Matthew N. Rocklein, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 23/576 (2013.01);
Abstract

Systems, apparatus, and methods related to tamper-resistant integrated circuits are described. The tamper-resistant integrated circuits include tamper-resistant features including a tamper-resistant material formulated or configured to exhibit a change in at least one electrical property responsive to exposure to oxygen, electromagnetic radiation, or other environmental conditions. Data located within the integrated circuit may be erased, or at least a portion of the integrated circuit may be destroyed, responsive to a change in the at least one electrical property. In some examples, one or more electrical properties of a tamper-resistant feature may be measured. A change in an electrical property may be an indication that the associated integrated circuit has been tampered with.


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