The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Jun. 19, 2018
Applicant:

Shin-etsu Chemical Co., Ltd., Tokyo, JP;

Inventors:

Takahiro Suzuki, Joetsu, JP;

Daisuke Domon, Joetsu, JP;

Masaaki Kotake, Joetsu, JP;

Keiichi Masunaga, Joetsu, JP;

Satoshi Watanabe, Joetsu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/039 (2006.01); G03F 7/004 (2006.01); G03F 7/038 (2006.01); C07C 309/42 (2006.01); C07C 309/25 (2006.01); C07C 309/29 (2006.01); C07C 309/35 (2006.01); C07C 309/38 (2006.01); C07C 309/44 (2006.01); C07C 309/59 (2006.01); C07C 323/66 (2006.01); C07C 309/39 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0392 (2013.01); C07C 309/25 (2013.01); C07C 309/29 (2013.01); C07C 309/35 (2013.01); C07C 309/38 (2013.01); C07C 309/39 (2013.01); C07C 309/42 (2013.01); C07C 309/44 (2013.01); C07C 309/59 (2013.01); C07C 323/66 (2013.01); G03F 7/0043 (2013.01); G03F 7/0045 (2013.01); G03F 7/0046 (2013.01); G03F 7/0382 (2013.01); G03F 7/0395 (2013.01); G03F 7/0397 (2013.01);
Abstract

The present invention provides a resist composition, including: (A) a sulfonium salt containing an anion and a cation, the cation including a partial structure shown by the following general formula (A1); and (B) a polymer compound containing a repeating unit shown by the following general formula (B1). The present invention provides a resist composition that causes few defects and is excellent in lithography performance, having regulated acid diffusion, in photolithography using a high energy beam as a light source, and a resist patterning process using this resist composition.


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