The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Apr. 13, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Bret Addison Johnson, Folsom, CA (US);

Vijayakrishna J. Vankayala, Allen, TX (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/54 (2006.01); G11C 29/00 (2006.01); G11C 29/12 (2006.01); G11C 29/14 (2006.01); G11C 29/36 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/789 (2013.01); G11C 29/12005 (2013.01); G11C 29/14 (2013.01); G11C 29/36 (2013.01); G11C 2029/0407 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1204 (2013.01);
Abstract

As described, a device may include detection circuitry to detect a deck of a memory array. The deck may include a conductive identifier coupled between a logic high voltage node and the detection circuitry a control circuit coupled to the detection circuit. The control circuit may perform operations including transmitting a test enable signal to the detection circuitry. The detection circuitry may generate a valid signal indicative of an existence of the conductive identifier of the deck in response to the test enable signal. The operations may also include the control circuit receiving the valid signal from the detection circuitry and adjusting a memory operation associated with the memory array based at least in part on the valid signal.


Find Patent Forward Citations

Loading…