The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 2021

Filed:

Apr. 01, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Dhamim Packer Ali, San Diego, CA (US);

Sreenivasulu Reddy Chalamcharla, San Diego, CA (US);

Ruchi Parekh, San Diego, CA (US);

Daison Davis Koola, San Diego, CA (US);

Dhaval Patel, San Diego, CA (US);

Eric Taseski, San Diego, CA (US);

Yanru Li, San Diego, CA (US);

Alexander Gantman, Solana Beach, CA (US);

Assignee:

QUALCOMM INCORPORATED, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/177 (2006.01); G06F 9/4401 (2018.01); G06F 9/445 (2018.01); G05B 13/02 (2006.01); G06F 1/3293 (2019.01); G06F 1/3234 (2019.01); G06F 1/324 (2019.01); G06F 15/76 (2006.01); G06F 21/57 (2013.01); G06F 30/30 (2020.01);
U.S. Cl.
CPC ...
G06F 15/177 (2013.01); G05B 13/021 (2013.01); G06F 1/324 (2013.01); G06F 1/3275 (2013.01); G06F 1/3293 (2013.01); G06F 9/4401 (2013.01); G06F 9/4403 (2013.01); G06F 9/4405 (2013.01); G06F 9/4416 (2013.01); G06F 9/44505 (2013.01); G06F 15/76 (2013.01); G06F 21/575 (2013.01); G06F 30/30 (2020.01);
Abstract

Various additional and alternative aspects are described herein. In some aspects, the present disclosure provides a method of calibrating a component. The method includes receiving previous calibration parameters for an external component at a secondary SoC from a primary SoC, wherein the secondary SoC is coupled to the external component and configured to calibrate the external component. The method further includes determining validity of the previous calibration parameters by the secondary SoC. The method further includes operating the external component by the secondary SoC based on the determined validity of the previous calibration parameters.


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