The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2021

Filed:

Jan. 29, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Mario Johannes Meissl, Austin, TX (US);

Wei Zhang, Austin, TX (US);

Byung-Jin Choi, Austin, TX (US);

Zhengmao Ye, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 59/02 (2006.01); G03F 7/00 (2006.01); B29C 35/02 (2006.01); B29C 37/00 (2006.01); B29C 59/00 (2006.01);
U.S. Cl.
CPC ...
B29C 59/021 (2013.01); B29C 35/02 (2013.01); B29C 37/0003 (2013.01); B29C 59/002 (2013.01); G03F 7/0002 (2013.01);
Abstract

In an embodiment, an imprint apparatus can include a substrate holder having a chucking region and a recessed support section; and a template holder, wherein the chucking region has more area as compared to a template region. In another embodiment, an imprint apparatus can include gas zones; and a gas controller that can be configured to adjust pressures within the gas zones to induce a convex curvature of a partial field of a workpiece used with the imprint apparatus. A method can include providing a workpiece within an imprint apparatus, wherein the workpiece includes a substrate and a formable material; and initially contacting a template with the formable material at a location spaced apart from the periphery of a partial field. In a particular embodiment, the method can further include modulating the substrate to form a convex shape contacting the template with the formable material.


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