The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Feb. 19, 2020
Applicant:

Winbond Electronics Corp., Taichung, TW;

Inventors:

Che-Jui Hsu, Taichung, TW;

Chun-Sheng Lu, Taichung, TW;

Ying-Fu Tung, Taichung, TW;

Mao-Chang Yen, Taichung, TW;

Wan-Yu Peng, Taichung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/8234 (2006.01); H01L 29/49 (2006.01); H01L 23/482 (2006.01); H01L 21/764 (2006.01); H01L 21/762 (2006.01); H01L 21/768 (2006.01); H01L 29/06 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823443 (2013.01); H01L 21/823468 (2013.01); H01L 29/4991 (2013.01); H01L 29/665 (2013.01); H01L 29/6653 (2013.01); H01L 21/764 (2013.01); H01L 21/7682 (2013.01); H01L 21/76264 (2013.01); H01L 21/76289 (2013.01); H01L 21/76889 (2013.01); H01L 23/4821 (2013.01); H01L 29/0649 (2013.01);
Abstract

A method for forming a semiconductor structure includes: providing a substrate; forming a stacked structure on the substrate; forming a barrier layer on a sidewall of the stacked structure; forming a first dielectric layer covering the barrier layer and the stacked structure; removing a portion of the first dielectric layer to expose an upper portion of the stacked structure; forming a metal layer covering the stacked structure and the first dielectric layer; performing an annealing process to react the metal layer with the stacked structure to form a metal silicide layer at the upper portion of the stacked structure; removing an unreacted portion of the metal layer; removing a portion of the barrier layer to form a recess above the barrier layer; and forming a second dielectric layer covering the metal silicide layer and the first dielectric layer to form air gaps on both sides of the stacked structure.


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