The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2021

Filed:

Jan. 10, 2019
Applicant:

Globalfoundries U.s. Inc., Santa Clara, CA (US);

Inventor:

Nicholas V. LiCausi, Watervliet, NY (US);

Assignee:

GLOBALFOUNDRIES U.S. INC., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/528 (2006.01); H01L 23/532 (2006.01); H01L 21/3105 (2006.01); H01L 21/311 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/7682 (2013.01); H01L 21/31053 (2013.01); H01L 21/31111 (2013.01); H01L 21/76819 (2013.01); H01L 21/76832 (2013.01); H01L 23/5283 (2013.01); H01L 23/53295 (2013.01); H01L 21/0228 (2013.01); H01L 21/02164 (2013.01); H01L 21/02178 (2013.01); H01L 21/02181 (2013.01); H01L 23/53228 (2013.01);
Abstract

Structures that include interconnects and methods for forming a structure that includes interconnects. A metallization level has a first interconnect, a second interconnect, and a cavity with an entrance between the first interconnect and the second interconnect. A first dielectric layer includes a first section arranged on the first interconnect adjacent to the entrance of the cavity and a second section arranged on the second interconnect adjacent to the entrance of the cavity. A second dielectric layer is formed on the first section of the first dielectric layer and the second section of the first dielectric layer. The second dielectric layer extends from the first section of the first dielectric layer to the second section of the first dielectric layer and across the entrance to the cavity to close an airgap between the first interconnect and the second interconnect.


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