The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Mar. 24, 2020
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Shih-Yao Lin, Hsinchu, TW;

Yi-Lin Chuang, Taipei, TW;

Yin-An Chen, Hsinchu, TW;

Shih Feng Hong, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/392 (2020.01); G06F 30/398 (2020.01); G06F 30/3953 (2020.01); G06N 20/10 (2019.01); G06F 30/27 (2020.01); G06N 3/08 (2006.01); G06F 30/396 (2020.01);
U.S. Cl.
CPC ...
G06F 30/392 (2020.01); G06F 30/27 (2020.01); G06F 30/396 (2020.01); G06F 30/398 (2020.01); G06F 30/3953 (2020.01); G06N 3/08 (2013.01); G06N 20/10 (2019.01);
Abstract

A method of generating an integrated circuit includes: placing a plurality of electronic components on a layout floor plan to generate a placing layout of the integrated circuit; forming a clock tree upon the placing layout to generate a synthesis layout of the integrated circuit; routing the synthesis layout to generate a routed layout of the integrated circuit; performing a DRC process upon the routed layout to obtain a layout region with a systematic DRC violation; generating a plurality of prediction gains of the layout region according to a plurality of placement recipes respectively; and generating an adjusted routing layout of the integrated circuit by adjusting the layout region with the systematic DRC violation according to a target placement recipe in the plurality of placement recipes.


Find Patent Forward Citations

Loading…