The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2021

Filed:

Oct. 18, 2019
Applicant:

Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai, CN;

Inventors:

Chong Liu, Shanghai, CN;

Jike Wu, Shanghai, CN;

Xiuliang Cao, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/35 (2006.01); H01L 21/02 (2006.01); C23C 14/18 (2006.01);
U.S. Cl.
CPC ...
C23C 14/35 (2013.01); C23C 14/185 (2013.01); H01L 21/02631 (2013.01);
Abstract

A semiconductor device and a method of fabricating the device are disclosed. The method of forming a metal layer includes: placing a substrate in a sputtering chamber; forming a first metal sub-layer on the substrate by performing a magnetron sputtering process; and forming a second metal sub-layer on the first metal sub-layer by performing another magnetron sputtering process and concurrently introducing a heated gas stream in the sputtering chamber, wherein the first metal sub-layer and the second metal sub-layer together constitute the metal layer and are each formed of aluminum doped with copper. The metal layer resulting from this method contains uniformly-sized small crystal grains separated from one another by minimal gaps between their grain boundaries. This imparts to the metal layer high surface flatness with fewer undesired bumps and hence good appearance, resulting in an increase in its yield.


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