The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Mar. 05, 2019
Applicant:

Visual Photonics Epitaxy Co., Ltd., Taoyuan, TW;

Inventors:

Yu-Chung Chin, Taoyuan, TW;

Chao-Hsing Huang, Taoyuan, TW;

Min-Nan Tseng, New Taipei, TW;

Kai-Yu Chen, Taoyuan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 33/00 (2010.01); H01L 21/00 (2006.01); H01L 29/08 (2006.01); H01L 29/205 (2006.01); H01L 29/737 (2006.01); H01L 27/082 (2006.01); H01L 29/732 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0817 (2013.01); H01L 27/0823 (2013.01); H01L 29/0804 (2013.01); H01L 29/0821 (2013.01); H01L 29/205 (2013.01); H01L 29/732 (2013.01); H01L 29/7371 (2013.01); H01L 29/7375 (2013.01); H01L 33/0025 (2013.01);
Abstract

The disclosure provides a high ruggedness HBT structure, including: a sub-collector layer on a substrate and formed of an N-type III-V semiconductor material; a collector layer on the sub-collector layer and formed of a III-V semiconductor material; a base layer on the collector layer and formed of a P-type III-V semiconductor material; an emitter layer on the base layer and formed of one of N-type semiconductor materials of InGaP, InGaAsP and InAlGaP; a first emitter cap layer on the emitter layer and formed of one of undoped or N-type semiconductor materials of AlGaAs, AlGaAsN, AlGaAsP, AlGaAsSb, and InAlGaAs, x having a highest value between 0.05≤x≤0.4, and y, z, r, w≤0.1; a second emitter cap layer on the first emitter cap layer and formed of an N-type III-V semiconductor material; and an ohmic contact layer on the second emitter cap layer and formed of an N-type III-V semiconductor material.


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