The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Jul. 05, 2018
Applicant:

C. Uyemura & Co., Ltd, Osaka, JP;

Inventor:

Shinji Ishimaru, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 2223/076 (2013.01);
Abstract

The purpose of the present invention is to provide a measurement method and a measurement device capable of accurately measuring various metal concentrations of metals included in a solution to be measured containing a plurality of additives and metals. An X-ray fluorescence analysis measurement method for measuring various metal concentrations of metals to be measured included in a solution to be measured containing one or more types of additives and metals based on measured values of X-ray fluorescence intensity, comprising: a calibration curve polynomial determination step Sfor determining polynomial approximations of calibration curves for the metals to be measured; a solution type correction polynomial determination step Sfor determining polynomial approximations for correcting error in the measured values of X-ray fluorescence intensity of the metals to be measured resulting from containing additives; a specific gravity correction polynomial determination step Sfor determining polynomial approximations for correcting error in the measured values of X-ray fluorescence intensity of the metals to be measured resulting from differences in specific gravity of the solution to be measured; and a metal concentration measurement step Sfor measuring various metal concentrations of the metals to be measured by using the polynomial approximations determined in the calibration curve polynomial determination step, the solution type correction polynomial determination step, and the specific gravity correction polynomial determination step.


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Ishimaru, Shinji. (2021). X-ray fluorescence analysis measurement method and x-ray fluorescence analysis measurement device (U.S. Patent No. 11047814). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11047814

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