The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Jun. 01, 2020
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Aswin Thiruvengadam, Folsom, CA (US);
Sivagnanam Parthasarathy, Carlsbad, CA (US);
Daniel Scobee, Ione, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 13/00 (2006.01); G11C 29/12 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 13/004 (2013.01); G11C 13/0069 (2013.01); G11C 29/12 (2013.01); G11C 29/56 (2013.01);
Abstract
Test resources of a test platform that are performing a test of memory components are determined. An indication that a particular test resource of the test resources of the test platform has failed can be received. The particular test resource is failed while performing a portion of the test of memory components. A remaining portion of the test of memory components can be performed based on the indication that the particular test resource of the test platform has failed.