The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Nov. 01, 2019
Applicant:

Stmicroelectronics International N.v., Schiphol, NL;

Inventors:

Venkata Narayanan Srinivasan, Greater Noida, IN;

Manish Sharma, Haryana, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G06F 11/267 (2006.01); G06F 11/27 (2006.01); G01R 31/3183 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318533 (2013.01); G01R 31/31705 (2013.01); G01R 31/318307 (2013.01); G01R 31/318519 (2013.01); G01R 31/318538 (2013.01); G01R 31/318555 (2013.01); G01R 31/318563 (2013.01); G01R 31/318572 (2013.01); G01R 31/318594 (2013.01); G06F 11/267 (2013.01); G06F 11/27 (2013.01); G01R 31/318558 (2013.01);
Abstract

A circuit includes a test data input (TDI) pin receiving a test data input signal, a test data out (TDO) pin outputting a test data output signal, and debugging test access port (TAP) having a test data input coupled to the TDI pin and a bypass register having an input coupled to the test data input of the debugging TAP. A multiplexer has inputs coupled to the TDI pin and the debugging TAP. A testing TAP has a test data input coupled to the output of the multiplexer, and a data register having an input coupled to the test data input of the testing TAP. The multiplexer switches so the test data input signal is selectively coupled to the input of the data register of the testing TAP so the output of the debugging TAP is selectively coupled to the input of the data register of the testing TAP.


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