The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2021

Filed:

Dec. 30, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Han-Chung Lin, Hsinchu, TW;

Chung-Yi Lin, Hsinchu County, TW;

Yen-Sen Wang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3953 (2020.01); G06F 30/398 (2020.01); G03F 1/36 (2012.01); H01L 23/522 (2006.01); H01L 23/00 (2006.01); H01L 23/528 (2006.01);
U.S. Cl.
CPC ...
G06F 30/3953 (2020.01); G03F 1/36 (2013.01); G06F 30/398 (2020.01); H01L 23/528 (2013.01); H01L 23/5226 (2013.01); H01L 24/13 (2013.01); H01L 2224/13025 (2013.01);
Abstract

A method of the present disclosure includes receiving a design layout; performing routing to the design layout to obtain a routed layout including an interconnect structure including a first metal layer, a second metal layer over the first metal layer, a third metal layer over the second metal layer, and a plurality of functional vias; performing optical proximity correction (OPC) operations to the routed layout to obtain an OPC'ed layout; and modifying the OPC'ed layout to obtain a modified layout. The modifying of the routed layout includes inserting a first plurality of dummy vias between the first metal layer and the second metal layer to avoid horizontal bridging between two adjacent metal lines in the first metal layer, and inserting a second plurality of dummy vias between the second metal layer and the third metal layer to avoid vertical coupling to the first plurality of dummy vias.


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