The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2021
Filed:
Apr. 09, 2020
Micron Technology, Inc., Boise, ID (US);
Harish Singidi, Fremont, CA (US);
Kishore Muchherla, Fremont, CA (US);
Ashutosh Malshe, Fremont, CA (US);
Vamsi Rayaprolu, San Jose, CA (US);
Sampath Ratnam, Boise, ID (US);
Renato Padilla, Jr., Folsom, CA (US);
Michael Miller, Boise, ID (US);
MICRON TECHNOLOGY, INC., Boise, ID (US);
Abstract
A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.