The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Oct. 03, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Li-Yen Lin, Wujie Township, Yilan County, TW;

Ching-Yu Chang, Yilang County, TW;

Chin-Hsiang Lin, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 7/16 (2006.01); H01L 21/311 (2006.01); H01L 21/033 (2006.01); G03F 7/09 (2006.01); G03F 7/039 (2006.01); H01L 21/027 (2006.01); G03F 7/004 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70025 (2013.01); G03F 7/0045 (2013.01); G03F 7/0397 (2013.01); G03F 7/094 (2013.01); G03F 7/168 (2013.01); G03F 7/70033 (2013.01); H01L 21/0273 (2013.01); H01L 21/0332 (2013.01); H01L 21/31105 (2013.01); H01L 21/31144 (2013.01);
Abstract

A method for forming a semiconductor device structure is provided. The method includes forming a material layer over a substrate and forming a resist layer over the material layer. The method includes exposing a portion of the resist layer by performing an exposure process. The resist layer includes a compound, and the compound has a carbon backbone, and a photoacid generator (PAG) group and/or a quencher group are bonded to the carbon backbone. The method also includes performing a baking process on the resist layer and etching a portion of the resist layer to form a patterned resist layer. The method includes patterning the material layer by using the patterned resist layer as a mask and removing the patterned resist layer.


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