The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Apr. 24, 2017
Applicant:
Unm Rainforest Innovations, Albuquerque, NM (US);
Inventors:
Steven R. J. Brueck, Albuquerque, NM (US);
Daniel Feezell, Albuquerque, NM (US);
John Randall, Albuquerque, NM (US);
Tito Busani, Albuquerque, NM (US);
Joshua B. Ballard, Albuquerque, NM (US);
Mahmoud Behzadirad, Albuquerque, NM (US);
Ashwin Krishnan Rishinaramangalam, Albuquerque, NM (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/10 (2010.01); G01Q 70/12 (2010.01); G01Q 60/16 (2010.01); B82B 3/00 (2006.01); G01Q 70/06 (2010.01); G01Q 70/14 (2010.01); G01Q 80/00 (2010.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G01Q 60/16 (2013.01); B82B 3/0004 (2013.01); G01Q 70/06 (2013.01); G01Q 70/10 (2013.01); G01Q 70/14 (2013.01); G01Q 80/00 (2013.01); G03F 7/0002 (2013.01); G01Q 70/12 (2013.01);
Abstract
Provided is a composite metal-wide-bandgap semiconductor tip for scanning tunneling microscopy and/or scanning, tunneling lithography, a method of forming, and a method for using the composite metal-wide-bandgap semiconductor tip.