The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Dec. 19, 2018
Applicant:
Sigray, Inc., Concord, CA (US);
Inventors:
Wenbing Yun, Walnut Creek, CA (US);
Srivatsan Seshadri, Pleasanton, CA (US);
Janos Kirz, Berkeley, CA (US);
Sylvia Jia Yun Lewis, San Francisco, CA (US);
Assignee:
Sigray, Inc., Concord, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2018.01); G01N 23/087 (2018.01); G01N 23/223 (2006.01); G21K 1/06 (2006.01); H01J 35/08 (2006.01); H01J 35/14 (2006.01); H01J 35/18 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2076 (2013.01); G01N 23/087 (2013.01); G01N 23/223 (2013.01); G21K 1/06 (2013.01); G21K 1/067 (2013.01); H01J 35/08 (2013.01); H01J 35/14 (2013.01); H01J 35/18 (2013.01); G01N 2223/04 (2013.01); G01N 2223/045 (2013.01); G01N 2223/0568 (2013.01); G21K 2201/064 (2013.01); H01J 35/112 (2019.05); H01J 2235/081 (2013.01); H01J 2235/086 (2013.01);
Abstract
An x-ray spectrometer system includes an x-ray source, an x-ray optical system, a mount, and an x-ray spectrometer. The x-ray optical system is configured to receive, focus, and spectrally filter x-rays from the x-ray source to form an x-ray beam having a spectrum that is attenuated in an energy range above a predetermined energy and having a focus at a predetermined focal plane.