The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Dec. 27, 2017
Applicant:

Spin Memory, Inc., Fremont, CA (US);

Inventors:

Danny Yam, Fremont, CA (US);

Jorge Vasquez, Fremont, CA (US);

Roberto Cordero, Fremont, CA (US);

Georg Wolf, Fremont, CA (US);

Assignee:

Spin Memory, Inc., Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/56 (2006.01); G11C 11/16 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2887 (2013.01); G11C 29/56016 (2013.01); G11C 11/161 (2013.01); G11C 29/006 (2013.01); G11C 2029/5602 (2013.01);
Abstract

A magnet mounting apparatus including a cage, a magnet carriage and first actuator for use in testing Magnetic Tunnel Junction (MTJ) devices. The cage can be configured for mounting to an Automated Test Equipment (ATE). The magnet carriage can be configured for coupling to a wafer test magnet. The first actuator can be coupled between the cage and the magnet carriage. The first actuator can be configured to move the magnet carriage between a first position and a second position along a z-axis. The first position can be configured for locating the wafer test magnet within a predetermined proximity to a Device Under Test (DUT) wafer, and the second position can be configured for replacing a probe card.


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