The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 02, 2021

Filed:

Dec. 27, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Jung Sheng Hoei, Newark, CA (US);

Peter Sean Feeley, Boise, ID (US);

Sampath K. Ratnam, Boise, ID (US);

Sead Zildzic, Rancho Cordova, CA (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G11C 16/34 (2006.01); G11C 16/26 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/073 (2013.01); G06F 11/0793 (2013.01); G11C 16/26 (2013.01); G11C 16/3431 (2013.01); G11C 16/0483 (2013.01);
Abstract

A processing device in a memory system receives a memory command indicating a read window size and a first read voltage and identifies a read window for a first data block of the memory component having the read window size and centered at the first read voltage. The processing device determines whether a number of bit flips for the first data block within the read window exceeds an error threshold and, in response to the number of bit flips exceeding the error threshold, refreshes data stored on the first data block of the memory component.


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