The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Sep. 23, 2019
Applicant:

Carl Zeiss Smt Gmbh, Oberkochen, DE;

Inventor:

Michael Patra, Oberkochen, DE;

Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G02B 5/02 (2006.01); G02B 5/08 (2006.01); G02B 6/10 (2006.01); G02B 17/06 (2006.01); G02B 27/28 (2006.01); G21K 1/06 (2006.01); H01S 3/09 (2006.01);
U.S. Cl.
CPC ...
G03F 7/7015 (2013.01); G02B 5/0215 (2013.01); G02B 5/0891 (2013.01); G02B 6/102 (2013.01); G02B 17/0605 (2013.01); G02B 27/288 (2013.01); G21K 1/067 (2013.01); H01S 3/0903 (2013.01);
Abstract

An optical assembly guides an output beam of a free electron laser to a downstream illumination-optical assembly of an EUV projection exposure apparatus. The optical assembly has first and a second GI mirrors, each with a structured reflection surface to be impinged upon by the output beam. A first angle of incidence on the first GI mirror is between one mrd and 10 mrad. A maximum first scattering angle is produced, amounting to between 50% and 100% of the first angle of incidence. A second angle of incidence on the second GI mirror is at least twice as large as the first angle of incidence. A maximum second scattering angle of the output beam amounts to between 30% and 100% of the second angle of incidence. The two planes of incidence on the two GI mirrors include an angle with respect to one another that is greater than 45°.


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