The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2021

Filed:

Jun. 08, 2018
Applicant:

Ebara Corporation, Tokyo, JP;

Inventors:

Masayuki Nakanishi, Tokyo, JP;

Yu Ishii, Tokyo, JP;

Kenya Ito, Tokyo, JP;

Keisuke Uchiyama, Tokyo, JP;

Makoto Kashiwagi, Tokyo, JP;

Assignee:

Ebara Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 55/12 (2006.01); B24B 21/00 (2006.01); B24B 41/06 (2012.01); B24B 47/12 (2006.01); B24D 11/02 (2006.01); B24B 21/08 (2006.01); B24B 7/22 (2006.01);
U.S. Cl.
CPC ...
B24B 55/12 (2013.01); B24B 7/228 (2013.01); B24B 21/004 (2013.01); B24B 21/08 (2013.01); B24B 41/067 (2013.01); B24B 47/12 (2013.01); B24D 11/02 (2013.01);
Abstract

A method and an apparatus which can efficiently polish an entirety of a back surface, including an outermost area thereof, of a substrate while the back surface of the substrate faces downward are disclosed. The method includes rotating a substrate by rotating a plurality of rollers about their respective own axes while the rollers contact a periphery of the substrate with a back surface of the substrate facing downward; and polishing an entirety of the back surface of the substrate by moving a polishing tool relative to the substrate while supplying a liquid onto the back surface of the substrate and while placing the polishing tool in contact with the back surface of the substrate, the polishing tool being located at a lower side of the substrate.


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