The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2021

Filed:

Dec. 17, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Aswin Thiruvengadam, Folsom, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Daniel Scobee, Ione, CA (US);

Frederick Jensen, El Dorado Hills, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/38 (2006.01); G11C 29/36 (2006.01); G06F 12/16 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G06F 3/0679 (2013.01); G06F 3/0688 (2013.01); G06F 11/1016 (2013.01); G06F 11/167 (2013.01); G06F 12/16 (2013.01); G11C 29/36 (2013.01);
Abstract

Filter information associated with a test to be performed with one or more memory components is determined. A set of memory components matching the filter information may be reserved for use in the testing. Test execution information defining a set of test processes of the test is determined. A connection with a first test process may be established and used to receive feedback information associated with execution of the test process. Based on the feedback information, a failure of the first test process may be identified.


Find Patent Forward Citations

Loading…