The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2021

Filed:

Mar. 03, 2020
Applicant:

Realtek Semiconductor Corp., HsinChu, TW;

Inventors:

I-Hsiu Lo, Hsinchu County, TW;

Yung-Jen Chen, Hsinchu County, TW;

Yu-Lan Lo, Hsinchu County, TW;

Shu-Yi Kao, Hsinchu County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 30/3323 (2020.01); G06F 30/3308 (2020.01); G06F 30/398 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3323 (2020.01); G06F 30/3308 (2020.01); G06F 30/398 (2020.01);
Abstract

A method of detecting a circuit malfunction in a register transfer level, RTL, design stage is disclosed. The method comprises obtaining signal points of each register from a circuit model based on the RTL design stage, generating a property list according to the signal points of each register, wherein the property list includes a property to be verified for each signal point, performing a formal verification operation according to the circuit model and the property list, to determine whether the property of the property list for each signal point in the circuit model is true, and generating a circuit malfunction result according to the signal point whose property is not true.


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