The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Mar. 28, 2019
Applicant:

Axcelis Technologies, Inc., Beverly, MA (US);

Inventors:

John F. Baggett, Georgetown, MA (US);

Ronald N. Reece, Westwood, MA (US);

Petros Miltiades Kopalidis, Swampscott, MA (US);

Assignee:

Axcelis Technologies, Inc., Beverly, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01J 37/20 (2006.01); H01J 37/317 (2006.01); H01L 21/683 (2006.01); H01L 21/687 (2006.01); G01K 13/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67248 (2013.01); G01K 13/00 (2013.01); H01J 37/20 (2013.01); H01J 37/3171 (2013.01); H01L 21/67103 (2013.01); H01L 21/6833 (2013.01); H01L 21/68721 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/31701 (2013.01);
Abstract

A thermal chuck selectively retains a workpiece on a clamping surface. The thermal chuck has one or more heaters to selectively heat the clamping surface and the workpiece. A thermal monitoring device determines a temperature of a surface of the workpiece when the workpiece resides on the clamping surface, defining one or more measured temperatures. A controller selectively energizes the one or more heaters based on the one or more measured temperatures. The thermal monitoring device may be one or more of a thermocouple or RTD in selective contact with the surface of the workpiece and an emissivity sensor or pyrometer not in contact with the surface. The thermal chuck can be part of an ion implantation system configured to implant ions into the workpiece. The controller can be further configured to control the heaters based on the measured temperatures.


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