The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2021

Filed:

Apr. 14, 2016
Applicant:

Longitude Flash Memory Solutions Ltd., Dublin, IE;

Inventors:

Sagy Charel Levy, Zichron Yaakov, IL;

Krishnaswamy Ramkumar, San Jose, CA (US);

Fredrick Jenne, Mountain House, CA (US);

Sam G. Geha, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11573 (2017.01); H01L 21/02 (2006.01); C23C 16/02 (2006.01); C23C 16/30 (2006.01); G11C 16/04 (2006.01); H01L 27/11568 (2017.01); H01L 21/28 (2006.01); H01L 29/51 (2006.01); H01L 29/792 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0214 (2013.01); C23C 16/0272 (2013.01); C23C 16/308 (2013.01); G11C 16/0466 (2013.01); H01L 21/022 (2013.01); H01L 21/02148 (2013.01); H01L 21/02211 (2013.01); H01L 21/02271 (2013.01); H01L 27/11568 (2013.01); H01L 29/40117 (2019.08); H01L 29/518 (2013.01); H01L 29/792 (2013.01); H01L 21/02164 (2013.01); H01L 21/02238 (2013.01); H01L 21/02255 (2013.01); H01L 29/7833 (2013.01);
Abstract

A semiconductor device including an oxide-nitride-oxide (ONO) structure having a multi-layer charge storing layer and methods of forming the same are provided. Generally, the method involves: (i) forming a first oxide layer of the ONO structure; (ii) forming a multi-layer charge storing layer comprising nitride on a surface of the first oxide layer; and (iii) forming a second oxide layer of the ONO structure on a surface of the multi-layer charge storing layer. Preferably, the charge storing layer comprises at least two silicon oxynitride layers having differing stochiometric compositions of Oxygen, Nitrogen and/or Silicon. More preferably, the ONO structure is part of a silicon-oxide-nitride-oxide-silicon (SONOS) structure and the semiconductor device is a SONOS memory transistor. Other embodiments are also disclosed.


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