The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2021

Filed:

Jul. 03, 2017
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventors:

Tsuyoshi Ohtsuki, Annaka, JP;

Tadashi Nakasugi, Takasaki, JP;

Hiroshi Takeno, Annaka, JP;

Katsuyoshi Suzuki, Takasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/265 (2006.01); H01L 21/20 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 21/2003 (2013.01); H01L 21/02381 (2013.01); H01L 21/265 (2013.01); H01L 29/78 (2013.01); Y02P 70/50 (2015.11);
Abstract

A method for manufacturing a semiconductor device, including forming a Fin structure on a semiconductor silicon substrate, performing ion implantation into the Fin structure, and subsequently performing recovery heat treatment on the semiconductor silicon substrate to recrystallize silicon of the Fin structure, wherein the Fin structure is processed so as not to have an end face of a {111} plane of the semiconductor silicon onto a sidewall of the Fin structure to be formed. It also includes a method for manufacturing a semiconductor device that is capable of preventing a defect from being introduced into a Fin structure when the Fin structure is subjected to ion implantation and recovery heat treatment.


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