The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 2020

Filed:

Jun. 17, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Lung Chen, Zhubei, TW;

Long-Jie Hong, Hsinchu, TW;

Kang-Min Kuo, Zhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/088 (2006.01); H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 21/285 (2006.01); H01L 21/8234 (2006.01); H01L 29/08 (2006.01); H01L 29/06 (2006.01); H01L 29/24 (2006.01); H01L 29/16 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0886 (2013.01); H01L 21/28518 (2013.01); H01L 21/823418 (2013.01); H01L 21/823431 (2013.01); H01L 21/823437 (2013.01); H01L 21/823481 (2013.01); H01L 29/0649 (2013.01); H01L 29/0847 (2013.01); H01L 29/16 (2013.01); H01L 29/24 (2013.01); H01L 29/66545 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01);
Abstract

A method of manufacturing a semiconductor device includes forming a first transistor structure and a second transistor structure on a substrate, wherein source/drain structures of the first transistor structure and the second transistor structure are merged. The first and second transistor structures are separated by etching the source/drain structures.


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