The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2020

Filed:

Feb. 12, 2018
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Shin-Jiun Kuang, Hsinchu, TW;

Tsung-Hsing Yu, Taipei, TW;

Yi-Ming Sheu, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/08 (2006.01); H01L 21/02 (2006.01); H01L 29/66 (2006.01); H01L 29/165 (2006.01); H01L 29/161 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7848 (2013.01); H01L 21/0243 (2013.01); H01L 21/0262 (2013.01); H01L 21/02532 (2013.01); H01L 21/02579 (2013.01); H01L 21/02639 (2013.01); H01L 29/0847 (2013.01); H01L 29/161 (2013.01); H01L 29/165 (2013.01); H01L 29/66477 (2013.01); H01L 29/66628 (2013.01); H01L 29/66636 (2013.01);
Abstract

Some embodiments of the present disclosure provide a method for fabricating a semiconductor structure. The method includes forming a recess in a substrate and forming an epitaxy region, comprising a multilayer structure with a substance having a first lattice constant larger than a second lattice constant of the substrate. Forming the epitaxy region further includes forming a first layer in proximity to an interface between the epitaxy region and the substrate with an average concentration of the substance from about 20 to about 32 percent by an in situ growth, and forming a second layer over the first layer, a bottom portion of the second layer having a concentration of the substance from about 27 percent to about 37 percent by an in situ growth operation.


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