The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2020

Filed:

Aug. 27, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Baohua Niu, Hsinchu, TW;

Ji-Feng Ying, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 11/16 (2006.01); G11C 13/00 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01); G11C 29/08 (2006.01); G11C 29/56 (2006.01); G11C 29/02 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12005 (2013.01); G11C 11/161 (2013.01); G11C 11/1673 (2013.01); G11C 13/0002 (2013.01); G11C 13/004 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01); G11C 29/08 (2013.01); G11C 29/44 (2013.01); G11C 29/50 (2013.01); G11C 29/56 (2013.01); G11C 11/1675 (2013.01); G11C 13/0069 (2013.01); G11C 2029/0403 (2013.01); G11C 2029/5006 (2013.01);
Abstract

A memory test system is disclosed that includes a memory integrated circuit (IC) and a memory functional tester. The memory IC includes a plurality of memory banks, where each memory bank includes a plurality of memory cells. The memory functional tester includes an adjustable voltage generator circuit, a read current measurement circuit, and a controller. The memory functional tester performs a write/read functional test on the memory bank over a number of write control voltages to determine a preferred write control voltage, where the preferred write control voltage is designated for use during subsequent write operations to the memory bank during an operational mode.


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