The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Sep. 22, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Tsan-Chun Wang, Hsinchu, TW;

Ziwei Fang, Hsinchu, TW;

Chii-Horng Li, Zhubei, TW;

Tze-Liang Lee, Hsinchu, TW;

Chao-Cheng Chen, Hsin-Chu, TW;

Syun-Ming Jang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/10 (2006.01); H01L 29/165 (2006.01); H01L 21/8238 (2006.01); H01L 21/306 (2006.01); H01L 21/3065 (2006.01); H01L 21/265 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66537 (2013.01); H01L 21/26513 (2013.01); H01L 21/3065 (2013.01); H01L 21/30608 (2013.01); H01L 21/823807 (2013.01); H01L 21/823878 (2013.01); H01L 21/823892 (2013.01); H01L 29/1054 (2013.01); H01L 29/165 (2013.01); H01L 29/66651 (2013.01);
Abstract

The present disclosure relates to a method of forming a transistor device. In this method, first and second well regions are formed within a semiconductor substrate. The first and second well regions have first and second etch rates, respectively, which are different from one another. Dopants are selectively implanted into the first well region to alter the first etch rate to make the first etch rate substantially equal to the second etch rate. The first, selectively implanted well region and the second well region are etched to form channel recesses having equal recess depths. An epitaxial growth process is performed to form one or more epitaxial layers within the channel recesses.


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