The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Oct. 11, 2018
Applicant:

Asm Ip Holding B.v., Almere, NL;

Inventors:

Atsuki Fukazawa, Tama, JP;

Masaru Zaitsu, Kawasaki, JP;

Assignee:

ASM IP Holding B.V., Almere, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/04 (2006.01); C23C 16/32 (2006.01); C23C 16/455 (2006.01); C23C 16/503 (2006.01); H01L 21/02 (2006.01); H01L 21/3065 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02529 (2013.01); C23C 16/325 (2013.01); C23C 16/45523 (2013.01); H01L 21/0262 (2013.01); H01L 21/3065 (2013.01); C23C 16/045 (2013.01); C23C 16/45527 (2013.01); C23C 16/45538 (2013.01); C23C 16/503 (2013.01); H01J 37/32449 (2013.01); H01J 2237/332 (2013.01); H01J 2237/334 (2013.01);
Abstract

A method of forming, on a substrate having a recess pattern, a silicon carbide film having a reflective index of 2.3 or higher as measured at 633 nm, includes (i) supplying an organosilane precursor in a pulse to a reaction space where the substrate is placed, which precursor has a formula of RSiHwherein R is a hydrocarbon-containing moiety including at least one unsaturated bond; (ii) continuously supplying a plasma-generating gas to the reaction space, which plasma-generating gas is selected from the group consisting of inert gases and hydride gases; (iii) continuously applying RF power to the reaction space to generate a plasma which excites the precursor; and (iv) repeating steps (i) through (iii), thereby forming a silicon carbide film on the substrate, which silicon carbide film has a reflective index of 2.3 or higher as measured at 633 nm.


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