The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Aug. 04, 2016
Hitachi, Ltd., Tokyo, JP;
Takahiro Yokoyama, Tokyo, JP;
Shinji Hamada, Tokyo, JP;
Noriaki Takahashi, Tokyo, JP;
Hirokazu Matsumoto, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Proposed is an evidence gathering system and method capable of reducing the burden on an operative performing system tests. A first agent which is installed in a client gathers evidence of a test result in the client at the time of a system test, and a second agent which is installed in a second server apparatus gathers evidence, of a test result in the second server apparatus at the time of the system test, which includes at least pre/post-update data of the database which has been updated as a result of the system test, gathers the evidence in the client of the system test from the first agent, gathers the evidence in the second server apparatus of the system test from the second agent, and integrates the gathered evidence for each of the system tests.