The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Aug. 26, 2014
Applicant:

Dowa Metaltech Co., Ltd., Tokyo, JP;

Inventors:

Kuniaki Miyagi, Tokyo, JP;

Takashi Suga, Tokyo, JP;

Tomotsugu Aoyama, Tokyo, JP;

Hiroto Narieda, Tokyo, JP;

Hideki Endo, Tokyo, JP;

Akira Sugawara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C22F 1/08 (2006.01); C22C 9/00 (2006.01); C22F 1/00 (2006.01); C22C 9/02 (2006.01); H01B 1/02 (2006.01);
U.S. Cl.
CPC ...
C22F 1/08 (2013.01); C22C 9/00 (2013.01); C22C 9/02 (2013.01); C22F 1/002 (2013.01); H01B 1/026 (2013.01);
Abstract

A copper alloy sheet material contains, in mass %, Fe: 0.05 to 2.50%, Mg: 0.03 to 1.00%, and P: 0.01 to 0.20%, and the contents of these elements satisfy the relation Mg-1.18(P—Fe/3.6)0.03. The Mg solid-solution ratio determined by the amount of dissolved Mg (mass %)/the Mg content of the alloy (mass %) ' 100 is 50% or more. The density of an Fe—P-based compound having a particle size of 50 nm or more is 10.00 particles/10 mmor less, and the density of an Mg—P-based compound having a particle size of 100 nm or more is 10.00 particles/10 mmor less. The Cu—Fe—P—Mg-based copper alloy sheet material is excellent in terms of electrical conductivity, strength, bending workability, and stress relaxation resistance in the case where load stress is applied in a direction perpendicular to both a rolling direction and a sheet thickness direction.


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