The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Aug. 14, 2017
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Mirko Liedtke, Jena, DE;

Jakob Haarstrich, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); H04N 5/235 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G02B 21/00 (2006.01); H04N 3/10 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2355 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 21/16 (2013.01); G02B 21/367 (2013.01); H04N 3/10 (2013.01);
Abstract

A method and arrangement for acquiring image data, wherein a pixel area of a specimen to be imaged is illuminated in a plurality of illumination events with illumination light of a respective selected intensity, which intensities are different from one another. Subsequently, detection light emanating from the respective pixel area is acquired for each of the intensities as image data of a subpixel and resulting image data of the pixel area are determined from the number of acquired image data of the subpixels. According to the invention, the illumination events are triggered successively. The image data of all subpixels of the pixel area are acquired before a further pixel area is illuminated.


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