The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2020

Filed:

Jul. 12, 2019
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Esha Dutta, Karnataka, IN;

Danish Jawed, Karnataka, IN;

Bhaskar Pal, Karnataka, IN;

Parijat Biswas, Karnataka, IN;

Pravash Chandra Dash, Karnataka, IN;

Rajarshi Mukherjee, Karnataka, IN;

Sharad Gaur, Larmatala, OM;

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/398 (2020.01);
U.S. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/398 (2020.01);
Abstract

A data analysis engine is implemented in a testbench to improve coverage convergence during simulation of a device-under-validation (DUV). During a first simulation phase initial stimulus data is generated according to initial random variables based on user-provided constraint parameters. The data analysis engine then uses a time-based technique to match coverage variables sampled from simulation response data with corresponding initial random variables, determines a functional dependency (relationship) between the sampled coverage variables and corresponding initial random variables, then automatically generates revised constraint parameters based on the functional dependency. The revised constraint parameters are then used during a second simulation phase to generate focused random variables used to stimulate the DUV to reach additional coverage variables. In one embodiment, the functional dependency is determined by cross-correlating sampled coverage variables and corresponding initial random variables.


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