The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Jul. 06, 2018
Applicants:

University of Washington Through Its Center for Commercialization, Seattle, WA (US);

Illumina, Inc., San Diego, CA (US);

Inventors:

Jens H. Gundlach, Seattle, WA (US);

Andrew Laszlo, Seattle, WA (US);

Ian Derrington, Seattle, WA (US);

Jeffrey G. Mandell, La Jolla, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C12Q 1/6869 (2018.01); B01D 57/02 (2006.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6869 (2013.01); B01D 57/02 (2013.01); G01N 33/48721 (2013.01);
Abstract

The present disclosure provides method and systems for improving nanopore-based analysis of polymers. The disclosure provides methods for selectively modifying one or more monomeric subunit(s) of a kind in a re-analyte polymer that results in a polymer analyte with a modified subunit. The polymer analyte produces a detectable signal in a nanopore-based system. The detectable signal, and/or its deviation from a reference signal, indicates the location of the modified subunit in the polymer analyte and, thus, permits the identification of the subunit at that location in the original pre-analyte polymer.


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