The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Apr. 11, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Ashutosh Malshe, Fremont, CA (US);

Harish Reddy Singidi, Fremont, CA (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Michael G. Miller, Boise, ID (US);

Sampath Ratnam, Boise, ID (US);

Xu Zhang, Shanghai, CN;

Jie Zhou, Shanghai, CN;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G11C 16/26 (2006.01); G06F 11/10 (2006.01); G06F 11/07 (2006.01); G06F 11/22 (2006.01); G06F 12/02 (2006.01); G11C 7/06 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 16/26 (2013.01); G06F 11/076 (2013.01); G06F 11/106 (2013.01); G06F 11/22 (2013.01); G06F 12/0246 (2013.01); G11C 7/06 (2013.01); G11C 16/3436 (2013.01); G06F 2212/7211 (2013.01); G11C 2207/2254 (2013.01);
Abstract

Devices and techniques for initiating and controlling preemptive idle time read scans in a flash based storage system are disclosed. In an example, a memory device includes a NAND memory array and a memory controller to schedule and initiate read scans among multiple locations of the memory array, with such read scans being preemptively triggered during an idle (background) state of the memory device, thus reducing host latency during read and write operations in an active (foreground) state of the memory device. In an example, the optimization technique includes scheduling a read scan operation, monitoring an active or idle state of host IO operations, and preemptively initiating the read scan operation when entering an idle state, before the read scan operation is scheduled to occur. In further examples, the read scan may preemptively occur based on time-based scheduling, frequency-based conditions, or event-driven conditions triggering the read scan.


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