The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Nov. 27, 2017
Applicant:

Shanghai Micro Electronics Equipment (Group) Co., Ltd., Shanghai, CN;

Inventors:

Ke Lan, Shanghai, CN;

Shihua Wang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 9/06 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G01C 9/06 (2013.01); G03F 7/70258 (2013.01);
Abstract

A focusing and leveling device calculates an amount of defocus and/or tilt of a substrate and includes an illumination unit, projection-side mark plate with projection-side slit mark, projection-side imaging group, deflection prism, beam splitter, detection unit and signal processing unit. A light beam emitted from the illumination unit passes through the projection-side mark plate and is trimmed into a probe beam directed by the projection-side imaging group onto a substrate surface. The prism deflects the probe beam reflected by the surface of the substrate for a first time so that it is incident on the substrate surface and reflected for a second time onto the projection-side imaging group. The beam splitter directs the probe beam that travelled through the projection-side imaging group onto the detection unit. The signal processing unit calculates the amount of defocus and/or tilt based on a measurement spot detected by the detection unit.


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