The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Oct. 02, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Hyun-Jun Sim, Hwaseong-si, KR;

Won-Oh Seo, Seoul, KR;

Sun-Jung Kim, Suwon-si, KR;

Ki-Yeon Park, Hwaseong-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/28 (2006.01); H01L 21/02 (2006.01); H01L 27/11 (2006.01); H01L 21/3213 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66795 (2013.01); H01L 21/0228 (2013.01); H01L 21/02164 (2013.01); H01L 21/02236 (2013.01); H01L 21/28185 (2013.01); H01L 21/28194 (2013.01); H01L 21/28211 (2013.01); H01L 27/1104 (2013.01); H01L 27/1116 (2013.01); H01L 21/0217 (2013.01); H01L 21/02252 (2013.01); H01L 21/02255 (2013.01); H01L 21/28079 (2013.01); H01L 21/32134 (2013.01); H01L 29/4958 (2013.01); H01L 29/66545 (2013.01);
Abstract

A method of fabricating a semiconductor device may include forming a fin structure on a substrate; forming an interface film having a first thickness on the fin structure using a first process; forming a gate dielectric film having a second thickness on the interface film using a second process different from the first process; and densifying the gate dielectric film using a third process different from the first and second processes. The second thickness may be greater than the first thickness, and the first thickness of the interface film may be unchanged after the densifying of the gate dielectric film.


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