The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Dec. 14, 2016
Applicants:

Mattson Technology, Inc., Fremont, CA (US);

Beijing E-town Semiconductor Technology Co., Ltd., Beijing, CN;

Inventors:

Alexandr Cosceev, Lonsee, DE;

Markus Hagedorn, Ulm, DE;

Christian Pfahler, Ulm, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/324 (2006.01); F27B 5/04 (2006.01); F27B 5/16 (2006.01); F27B 5/18 (2006.01); H01L 21/67 (2006.01); H01L 21/687 (2006.01); H01L 21/268 (2006.01); H05B 3/00 (2006.01); F27B 17/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/324 (2013.01); H01L 21/2686 (2013.01); H01L 21/6719 (2013.01); H01L 21/67109 (2013.01); H01L 21/67115 (2013.01); H01L 21/68785 (2013.01); H05B 3/0047 (2013.01); F27B 5/04 (2013.01); F27B 5/16 (2013.01); F27B 17/0025 (2013.01);
Abstract

Systems and methods for improving process uniformity in a millisecond anneal system are provided. In some implementations, a process for thermally treating a substrate in a millisecond anneal system can include obtaining data indicative of a temperature profile associated with one or more substrates during processing in a millisecond anneal system. The process can include one or more of (1) changing the pressure inside the processing chamber of the millisecond anneal system; (2) manipulating the irradiation distribution by way of the refracting effect of a water window in the millisecond anneal system; (3) adjusting the angular positioning of the substrate; and/or (4) configuring the shape of the reflectors used in the millisecond anneal system.


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