The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2020

Filed:

Nov. 27, 2017
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventor:

Isao Yokokawa, Takasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/762 (2006.01); H01L 27/12 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76251 (2013.01); H01L 21/02 (2013.01); H01L 21/02052 (2013.01); H01L 27/12 (2013.01);
Abstract

A method for manufacturing an SOI wafer, including steps of: bonding a bond wafer and a base wafer each composed of a silicon wafer at room temperature with a silicon oxide film interposed therebetween; a thinning the bond wafer; and before the bonding step, cleaning the wafers with a hydrophilic cleaning liquid and drying the cleaned wafers by suction drying or spin drying. After the drying step is ended and before the bonding step is started, the wafers are stored until a state where a bonding speed at which the bonding step is to be performed is 20 mm/second or less. The bonding is performed with the bonding speed of 20 mm/second or less. This provides a method for manufacturing an SOI wafer by which an SOI wafer can be manufactured while generation of outer-peripheral micro voids is suppressed in a simple manner.


Find Patent Forward Citations

Loading…