The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2020

Filed:

Dec. 17, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Yi-Shan Chen, Tainan, TW;

Chan-Syun David Yang, Hsinchu, TW;

Li-Te Lin, Hsinchu, TW;

Pinyen Lin, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 21/768 (2006.01); H01L 21/311 (2006.01); H01L 21/033 (2006.01); H01L 23/528 (2006.01); H01L 21/32 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76804 (2013.01); H01L 21/0331 (2013.01); H01L 21/0337 (2013.01); H01L 21/31122 (2013.01); H01L 21/31138 (2013.01); H01L 21/31144 (2013.01); H01L 21/32 (2013.01); H01L 23/5283 (2013.01); H01L 21/02115 (2013.01); H01L 21/02282 (2013.01); H01L 21/0332 (2013.01);
Abstract

A method is provided. A sacrificial layer is formed over a semiconductor substrate. An etching process is performed to form an opening in the sacrificial layer. The etching process includes a first cycle and a second cycle performed after the first cycle, and each of the first cycle and the second cycle includes applying a passivation gas and an etchant gas over the sacrificial layer, and performing an ionized gas bombardment on the sacrificial layer after applying the passivation gas and the etchant gas over the sacrificial layer. The passivation gas is applied at a first flow rate in the first cycle and is applied at a second flow rate in the second cycle, and the first flow rate is higher than the second flow rate.


Find Patent Forward Citations

Loading…