The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2020

Filed:

May. 29, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Ting-Li Yang, Tainan, TW;

Wei-li Huang, Pingtung, TW;

Sheng-Pin Yang, Kaohsiung, TW;

Chi-Cheng Chen, Tainan, TW;

Hon-Lin Huang, Hsinchu, TW;

Chin-Yu Ku, Hsinchu, TW;

Chen-Shien Chen, Zhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/00 (2006.01); H01L 23/04 (2006.01); H01L 23/522 (2006.01); H01L 49/02 (2006.01); H01F 41/04 (2006.01); H01F 17/00 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76816 (2013.01); H01F 17/0013 (2013.01); H01F 17/0033 (2013.01); H01F 41/046 (2013.01); H01L 21/76877 (2013.01); H01L 23/04 (2013.01); H01L 23/5226 (2013.01); H01L 23/53295 (2013.01); H01L 24/11 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 28/10 (2013.01); H01F 2017/004 (2013.01); H01L 2224/0401 (2013.01); H01L 2924/163 (2013.01);
Abstract

A method for forming a semiconductor device structure is provided. The method includes forming a first conductive line over a substrate. The method includes forming a first protection cap over a first portion of the first conductive line. The first protection cap and the first conductive line are made of different conductive materials. The method includes forming a first photosensitive dielectric layer over the substrate, the first conductive line, and the first protection cap. The method includes forming a first opening in the first photosensitive dielectric layer and over the first protection cap. The method includes forming a conductive via structure and a second conductive line over the first conductive line. The conductive via structure is in the first opening and over the first protection cap, and the second conductive line is over the conductive via structure and the first photosensitive dielectric layer.


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