The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Sep. 10, 2018
Huazhong University of Science and Technology, Wuhan, Hubei, CN;
Hao Jiang, Wuhan, CN;
Jiamin Liu, Wuhan, CN;
Shiyuan Liu, Wuhan, CN;
Song Zhang, Wuhan, CN;
Zhicheng Zhong, Wuhan, CN;
Xiuguo Chen, Wuhan, CN;
Honggang Gu, Wuhan, CN;
Huazhong University of Science and Technology, Wuhan, Hubei, CN;
Abstract
The present invention discloses a high temporal resolution Mueller matrix elliptical polarization measuring device and method. In the incident light path, four polarization modulation channels are used to split and modulate a pulse laser beam into four polarized beams in independent polarization states. Due to different light path differences, the pulse beams have a time interval of several nanoseconds, and thus four pulse laser beams are successively irradiated on the surface of the sample. In the reflected light path, six channel polarization detection modules are used to synchronously measure the Stokes vectors of the reflected beams on the sample surface. By using known incident and reflected Stokes vectors of the four pulse beams, linear equations can be solved to obtain the Mueller matrix of the sample.